dsfwer

    • Daddyo@lemmy.ca
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      1 year ago

      Dynamic secondary ion mass spectrometers, or D-SIMS for short. It’s an analytical tool to measure very low concentrations of elements in materials. We use it to help mining companies find gold that’s wrapped up in various minerals like pyrite.

      • TonyTonyChopper@mander.xyz
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        1 year ago

        I feel like on the scale of mining industry you would benefit from just getting a new instrument to be honest. Also from what I’ve read SIMS is only surface sensitive, why don’t you use something that analyzes the bulk? In my lab (mineral-adjacent chemistry) we use ICP-OES for elemental analysis and get sub-ppm easily.